Document Type : Research Paper
Authors
1
Plant Breeding, Faculty of Agriculture, Lorestan University, Lorestan, Iran
2
Associate Professor, Faculty of Agriculture, Razi University, Kermanshah, Iran, and Associate Professor, Biotechnology Research Department for Drought Resistance, Razi University, Kermanshah, Iran
3
Assistant Professor, Respectively, Seed and Plant Improvement Institute, Kermanshah, Iran
4
Respectively, Seed and Plant Improvement Institute, Kermanshah, Iran
5
Assistance Professor, Faculty of Agriculture, Razi University, Kermanshah, Iran
Abstract
In order to study the yield component traits of grain in bread wheat genotypes, 200 lines of CIMMYT origin bread wheat were cultured and evaluated in augmented design by four control lines in ten blocks in 2010-2011 growing season. Using stepwise regression analysis, five and four traits entered to regression model under stress (R2 = 0.41) and normal (R2 = 0.38) conditions, respectively. Path analysis results showed that the traits day to stem (P= -0.369) and number seed per spike (P=0.264) had the highest direct effect on seed yield under stress and normal conditions, respectively. In normal conditions, the trait thousand seed weight (434/0) showed most direct effect of on the yield that could be used as a criterion in wheat breeding programs for selecting superior genotypes. Factors analysis in stress and non-stress conditions indicated eight factors justifying 67.96درصد and 69.43درصد out of total variance, respectively. Based on the survey results, grain yield is strongly affected by yield component traits and these traits are considered as an important measure for improving bread wheat genotypes in order to achieve better performance and more favorable genotypes.
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